Multi-head atomic force nanoprober provides greater understanding of semiconductor integrated circuit design and failure points

The AFP is a high-resolution imaging and probing tool that electrically characterizes advanced circuitry: a method of measuring devices and identifying failures that would otherwise be invisible to even the most sophisticated optical microscopes.

See AFP Product Specifications →

ADVANCED CIRCUIT IMAGING

PicoCurrent
IV Curves
Capacitance Imaging (SCM)

AFP DEVELOPMENT REPORT

MultiProbe™, supports scientific advancements as Moore's Law gains momentum.

Ph.D Peter Harris discusses MultiProbe's emergence into the realm of 32nm-22nm qualified technology and where development is heading.

COMPANY SCOPE

Patents

Software synchronization of multiple scanning probes

Deconvolving tip artifacts using multiple scanning probes

Detection system for atomic force microscopes

more about patents→

SPOTLIGHT

Intel Report:

Revolutionizing How We Use Technology —Today and Beyond.

IBM Report:

LED chip alliance delivers major semiconductor performance leap.

AFP APPLICATIONS

ISTFA 2008:

Calibration of Nanoprobe Capacitance-Voltage Spectroscopy (NCVS)

ISTFA 2007:

Challenges of Atomic Force Probe Characterization of Logic Based Embedded DRAM for On-Processor Applications

ISTFA 2006:

Atomic Force Probe Kelvin Measurements of Large MOSFET Devices at Contact Level for Accurate Device Threshold Characteristics