NanoProbing

Electrical Characterization: The AFP enables DC and AC probing on discrete nanoscale devices providing complete Electrical Characterization of the devices output and transfer performance.

Leakage Defects

PicoCurrent™: Unique to Multiprobe’s AFP, this CAFM imaging mode uses pico Amp level current sensitivity to quickly identify a broad range of critical leakage and resistive defects.

Dopant Defects

Scanning Capacitance (NanoCapacitance Voltage Spectroscopy) locates dopant defects both in cross-section and top-down, which are invisible to other techniques.