Multi-head atomic force nanoprober provides greater understanding of semiconductor integrated circuit design and failure pointsThe AFP is a high-resolution imaging and probing tool that electrically characterizes advanced circuitry: a method of measuring devices and identifying failures that would otherwise be invisible to even the most sophisticated optical microscopes. See AFP Product Specifications → |
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ADVANCED CIRCUIT IMAGINGPicoCurrentIV Curves Capacitance Imaging (SCM)
AFP DEVELOPMENT REPORTMultiProbe™, supports scientific advancements as Moore's Law gains momentum.Ph.D Peter Harris discusses MultiProbe's emergence into the realm of 32nm-22nm qualified technology and where development is heading.
COMPANY SCOPEPatents
Software synchronization of multiple scanning probes Deconvolving tip artifacts using multiple scanning probes Detection system for atomic force microscopes
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SPOTLIGHTIntel Report:Revolutionizing How We Use Technology —Today and Beyond.
IBM Report:LED chip alliance delivers major semiconductor performance leap.
AFP APPLICATIONS
ISTFA 2008:Calibration of Nanoprobe Capacitance-Voltage Spectroscopy (NCVS)
ISTFA 2007:Challenges of Atomic Force Probe Characterization of Logic Based Embedded DRAM for On-Processor Applications
ISTFA 2006:
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NEWS & EVENTS
MultiProbe™ now ISO 9001 : 2008 Certified read more→ MultiProbe⢠AFP is 22nm Ready New Electrical Characterization Service read more→
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