Manufacturer of the Atomic Force
ADVANCED CIRCUIT IMAGINGPicoCurrent
Capacitance Imaging (SCM)
AFP DEVELOPMENT REPORTMultiProbe™, supports scientific advancements as Moore's Law gains momentum.
Ph.D Peter Harris discusses MultiProbe's emergence into the realm of 32nm-22nm qualified technology and where development is heading.
Software synchronization of multiple scanning probes
Detection system for atomic force microscopes
Intel Report:Revolutionizing How We Use Technology —Today and Beyond.
IBM Report:LED chip alliance delivers major semiconductor performance leap.
ISTFA 2008:Calibration of Nanoprobe Capacitance-Voltage Spectroscopy (NCVS)
ISTFA 2007:Challenges of Atomic Force Probe Characterization of Logic Based Embedded DRAM for On-Processor Applications
NEWS & EVENTS
MultiProbe™ forms european alliance
Dr. Peter Harris provides insight into SCM at EDFAS chapter meeting
MultiProbe™ now ISO 9001 : 2008 Certified read more→
MultiProbe™ AFP is sub 20nm Ready