Advanced Technology for Semiconductor Failure Analysis
MultiProbe™ was founded in 2001 to address the growing needs of Failure Analysis engineers, and to help the industry find solutions for deep sub-micron device technology development. MultiProbe’s founder and CEO, Andy Erickson, leveraged many years of experience as both a semiconductor device engineer and later as an AFM instrument designer to lead the development of MultiProbe’s core technologies and IP. In the following years, MultiProbe has grown to become a leading innovator in the field of semiconductor failure analysis and R&D.
MultiProbe has continuously met the challenges posed by advancing technology nodes with new tools that have revolutionized the FA industry. MultiProbe’s Atomic Force nanoProber (AFP) is a nondestructive semiconductor fault isolation and probing tool that has proven capability on today’s smallest technology nodes. Leading semiconductor companies around the world rely on the AFP as a key measurement capability in their FA process flow.
MultiProbe also places great emphasis on customer service and support. In addition to providing our customers with on-site training, we are always readily available to make sure they have sufficient knowledge to utilize the AFP to its full potential. At MultiProbe, we pride ourselves on our commitment to helping our customers succeed with Measurements You Trust™.