Manufacturer of the Atomic Force
Nanoprober (AFP)

The AFP is a high-resolution imaging and probing tool that electrically characterizes advanced semiconductor circuitry and identifies failures that would otherwise be invisible to even the most sophisticated optical microscopes.

See AFP Product Specifications →

ADVANCED CIRCUIT IMAGING

PicoCurrent
IV Curves
Capacitance Imaging (SCM)

AFP DEVELOPMENT REPORT

MultiProbe™, supports scientific advancements as Moore's Law gains momentum.

Ph.D Peter Harris discusses MultiProbe's emergence into the realm of 32nm-22nm qualified technology and where development is heading.

COMPANY SCOPE

Patents

Software synchronization of multiple scanning probes

Deconvolving tip artifacts using multiple scanning probes

Detection system for atomic force microscopes

more about patents→

SPOTLIGHT

Intel Report:

Revolutionizing How We Use Technology —Today and Beyond.

IBM Report:

LED chip alliance delivers major semiconductor performance leap.

AFP APPLICATIONS

ISTFA 2008:

Calibration of Nanoprobe Capacitance-Voltage Spectroscopy (NCVS)

ISTFA 2007:

Challenges of Atomic Force Probe Characterization of Logic Based Embedded DRAM for On-Processor Applications

ISTFA 2006:

Atomic Force Probe Kelvin Measurements of Large MOSFET Devices at Contact Level for Accurate Device Threshold Characteristics

multiprobe for fault isolation

more papers→

NEWS & EVENTS

ASM offers free ISTFA Expo Hall pass
read more→

MultiProbe™ forms european alliance
read more→

Dr. Peter Harris provides insight into SCM at EDFAS chapter meeting
read more→

MultiProbe™ now ISO 9001 : 2008 Certified read more→

MultiProbe™ AFP is 22nm Ready
read more→

New Electrical Characterization Service read more→

Manufacturer of the Atomic Force Nanoprober (AFP)