March 11th, 2010

Fault Isolation and Nanoprobing Capabilities Within a Single Tool     Multiprobe nanoprober chinese site link    Multiprobe nanoprober Japanese Link    

new products

MultiProbe 6 nanoprober heads

Six Head AFP Capabiity

Enables simultaneous, multiple imaging and probing of source, drain, well, gate, substrate and all critical nodes for eDRAM, with nanometer resolution. go see new product

   
MultiProbe multiscan software

MultiScan III Automation Software

Designed and written for ease of use and to facilitate workflow. It puts routine tasks such as turning on lasers, engaging heads, changing PicoCurrent gains, and scanning at the user’s fingertips. go see new product

   
Cad Navigation

CAD Navigation

Adjustable image overlay allows the user to vary the transparency of each scanned image. This functionality dramatically improves product intuitiveness and user productivity. go see new product

   
Non-contact imaging of soft metals

Non-Contact Imaging

Non-contact imaging is ideal for imaging soft metals or challenging topography without smearing or damage to samples. go see new product

   
MultiProbe Thermal Chuck

Thermal Chuck

Provides the optimal environment for thermal intensive customer specifications.
Heats to 120°C +/-.01° go see new product