MultiProbe News
- MultiProbe Founder, Andy Erickson, will be a Guest Speaker at Stanford University’s Center for Probing the Nanoscale
- The 4th Annual Nanoprobes Workshop, Friday, May 23rd, 2008 Mr. Erickson joins academic and industry leaders and entrepreneurs from Intel, Agilent, Hitachi and others, as a guest speaker at this one-day workshop. His presentation focuses on the advanced capabilities provided by multiple scanned probes, including nanoscale transistor and nanowire probing, in support of scientific progress in the fields of biology and nanotechnology. More information...
- Agilent Technologies and MultiProbe to Bring World’s Highest-Resolution Nanoprober to Asia
- Agilent Technologies Inc. and MultiProbe Inc. today announced their intent to expand the companies’ strategic partnership. Read more...
- MultiProbe’s Atomic Force Nanoprober is 32nm ready
- Two of our largest customers have succesfully used our tool to characterize failures on their latest 32nm devices. 10.25.2007
- The SNAP nanopositioning stage speeds up work
- “The SNAP stage is great. Since we purchased it, I haven’t used the FIB to mark at all. I can navigate to any SRAM cell I want.” says Stefan Müller of Infineon AG, Germany, Failure Analysis Group for Logic Products. 09.10.2007
- MultiProbe Inc. ranked #68 in Entrepreneur magazine’s Hot 500 for 2007
- “Which companies are carrying the Hot 500 banner this year? Representing nearly every industry, these businesses have exceeded annual sales of $1 million and shown positive job growth measured over a four-year period.” 08.01.2007 Read more...
- MultiScan III seeded to selected customers for Beta testing
- Over a year in the making, MultiScan III is now in beta testing. Selected customers are begining to use the new software for their day-to-day probing. The software was entirely re-written in C# for improved speed, expandibility, and incredible new funtionality. Once released later this year, an upgrade path will be offered to all our customers. 07.05.2007
