MultiProbe News
- SCM applications in FA: Theory, Optimization Techniques and Sample Preparation
- August 2009 Santa Barbara, CA– Dr. Peter Harris, MultiProbe General Manager and Director of Development, speaks at the Golden Gate Chapter of EDFAS meeting on Thursday, August 13th from 6:30 -8:00pm at the Silicon Valley Technology Center Cantina/ Nano Lab Technologies, 3833 North First Street, San Jose, CA.
- Dr. Harris discusses SCM applications in FA: Theory, Techniques, Optimization and Sample Preparation. As one of the original pioneers that commercialized the Scanning Capacitance technique, Dr. Harris offers a developer’s insight into how it works and why SCM can be used to determine dopant profiles. He also addresses SCM’s inherent limitations and what may limit the interpretation of results.
- For more information on attending this and other EDFAS chapter meetings, please email Jerome Mazur, Technical Program Chair, EDFAS Golden Gate Chapter.
- EDFAS GOLDEN GATE CHAPTER is an Affiliate Society of ASM International, and the only EDFAS chapter in California.
- BIO: Dr. Peter Harris received a Bachelor of Science in Astrophysics from the University of Leicester, UK in 1992 and a PhD in the Characterization of Light Emitting Porous Semiconductors from DeMontfort University in 1995.
- Following his role as Technical Manager with Digital Instruments in the U.K., Dr. Harris moved to DI’s Santa Barbara office in 2000 to support Andy Erickson (then Senior Staff Scientist directing the electrical characterization group). Later in that year, when Mr. Erickson left to form MultiProbe™, Dr. Harris took over his position and continued his work in areas such as scanning capacitance microscopy and tunneling AFM.
- Dr. Harris joined MultiProbe in 2007. He is a member of several professional societies including EDFAS.
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- MultiProbe™ Earns ISO 9001:2008 Certification
- March 2009 Santa Barbara, CA– MultiProbe Inc., the world’s leading supplier of nanoprobing tools to the semiconductor industry, has embraced the high quality standards established by the International Organization for Standardization (ISO). Following a rigorous Registrar audit, MultiProbe recently earned ISO 9001:2008 certification for its quality management system (QMS).“The ISO 9001:2008 certification signifies a standard of excellence we are proud to have met and committed to defend in coming years,” says Andy Erickson, MultiProbe founder and CEO. Read full story...
What is ISO?... - MultiProbe’s Atomic Force Nanoprober is 22nm ready
- February 2009 A world-leading microelectronics company, one of MultiProbe's most progressive customers, is successfully using the AFP tool to characterize failures on its latest 22nm devices.
- MultiProbe™ Announces the Release of Thermal Chuck
- November 2008 MultiProbe’s Thermal Chuck is designed specifically for use with the MultiScan AFP system and is used successfully to probe at levels of 45nm and below. For AFP users that require device testing in a temperature-controlled environment, MultiProbe’s Thermal Chuck does the job efficiently without altering image quality or probing experience.
- MultiProbe™ Founder, Andy Erickson, will be a Guest Speaker at Stanford University’s Center for Probing the Nanoscale
- The 4th Annual Nanoprobes Workshop, Friday, May 23rd, 2008 Mr. Erickson joins academic and industry leaders and entrepreneurs from Intel, Agilent, Hitachi and others, as a guest speaker at this one-day workshop. His presentation focuses on the advanced capabilities provided by multiple scanned probes, including nanoscale transistor and nanowire probing, in support of scientific progress in the fields of biology and nanotechnology. More information...
- Agilent Technologies and MultiProbe™ to Bring World’s Highest-Resolution Nanoprober to Asia
- Agilent Technologies Inc. and MultiProbe Inc. today announced their intent to expand the companies’ strategic partnership. Read more...
- MultiProbe’s Atomic Force Nanoprober is 32nm ready
- Two of our largest customers have succesfully used our tool to characterize failures on their latest 32nm devices. 10.25.2007
- The SNAP nanopositioning stage speeds up work
- “The SNAP stage is great. Since we purchased it, I haven’t used the FIB to mark at all. I can navigate to any SRAM cell I want.” says Stefan Müller of Infineon AG, Germany, Failure Analysis Group for Logic Products. 09.10.2007
- MultiProbe™ Inc. ranked #68 in Entrepreneur magazine’s Hot 500 for 2007
- “Which companies are carrying the Hot 500 banner this year? Representing nearly every industry, these businesses have exceeded annual sales of $1 million and shown positive job growth measured over a four-year period.” 08.01.2007 Read more...
- MultiScan III seeded to selected customers for Beta testing
- Over a year in the making, MultiScan III is now in beta testing. Selected customers are begining to use the new software for their day-to-day probing. The software was entirely re-written in C# for improved speed, expandibility, and incredible new funtionality. Once released later this year, an upgrade path will be offered to all our customers. 07.05.2007
