Press Release

Santa Barbara, CA, USA (April 20, 2004) – MultiProbe is pleased to announce a complete solution for probing the next generation nanoscale transistors. The MultiScan™ Atomic Force Probe (AFP) allows users to quickly and repeatedly measure electrical performance characteristics on today’s 90nm and 65nm transistors, with technology that will continue to provide measurements on tomorrow’s 45nm transistors. The MultiScan AFP uses multiple, specialized atomic force microscope (AFM) heads, which allow the user to locate a failing transistor and contact incredibly close-spaced terminals. Patent pending MultiScan software controls the AFPs, saving time by allowing the user to place probes easily, making previously expensive, time consuming measurements routine.

MultiProbe’s MultiScan AFP is offered with flexible configurations to meet a number of budgetary and performance requirements. Optional scan modes such as current mapping and high frequency probing allow users to locate, characterize and then probe failing devices in the same analysis. No other probing tool can offer a more efficient, reliable solution to today’s semiconductor probing needs.

MultiProbe develops and manufactures the world’s highest resolution nanoprobing tools. Companies use our instruments to characterize the smallest, high performance semiconductor devices on integrated circuits. MultiProbe is located in Santa Barbara, CA, USA. Visit our website at www.multiprobe.com or email us at info@multiprobe.com and change the way you look at transistors for generations to come.