July 4th, 2008

Press Release

MultiProbe’s MultiScan™ Atomic Force Prober awarded prestigious 2004 R&D 100 Award.

Santa Barbara, CA, USA (July 27, 2004) – MultiProbe, Inc. is proud to announce that the MultiScan™ Atomic Force Probe has been awarded a prestigious 2004 R&D 100 Award. For the past 42 years, R&D magazine has been holding an annual competition to name the top 100 most technologically innovative products of the year, providing products with a mark of excellence known to industry, government and academia worldwide.


The MultiScan™ Atomic Force Probe (AFP) allows users to quickly and repeatedly measure electrical performance characteristics on today’s 90nm and 65nm transistors, with technology that will continue to provide measurements on tomorrow’s 45nm transistors.


“Having recognized the need for such a product in the semiconductor industry, we worked diligently to bring the MultiScan AFP to the market,” says Andy Erickson, President and founder of MultiProbe. “We are thrilled to have our product recognized by the judges and editors of R&D magazine as one of the top 100 most technologically innovative new products.”


Over the years, the R&D 100 Awards have recognized winning products with such household names as Polacolor film (1963), the flashcube (1965), the automated teller machine (1973), the halogen lamp (1974), the fax machine (1975), the liquid crystal display (1980), the printer (1986), the Nicoderm antismoking patch (1992), Taxol anticancer drug (1993) and HDTV (1998).


Casey Hare, Vice President and co-founder of MultiProbe says, “It is a true honor to join the ranks of past R&D 100 Award winners. The list includes products which have transformed the technological world and it is extremely gratifying to have our product counted among such innovations.”


The full list of winners will be announced in the September 2004 issue of R&D magazine. To learn more about the R&D 100 Awards or to see a list of previous winners, go to www.rdmag.com.


MultiProbe develops and manufactures the world’s highest resolution nanoprobing tools. Companies use our instruments to characterize the smallest, high performance semiconductor devices on integrated circuits. MultiProbe is located in Santa Barbara, CA, USA. Visit our website at www.multiprobe.com or email us at info@multiprobe.com and change the way you look at transistors for generations to come.

 
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contact
MultiProbe Inc.
819 Reddick Street
Santa Barbara, CA 93103-3124
Tel +1 805.560.0404
Fax +1 805.560.0414