Press Release

Santa Barbara, CA, USA (January 22, 2009) – MultiProbe™, the developer and manufacturer of the Atomic Force Nanoprober (AFP), announces the release of a Guarded Thermal Chuck, designed specifically to interface with the AFP MultiScan software system. The unit has been proven to successfully probe at levels of 45nm and below; AFP users are now able to perform fault isolation techniques at elevated temperatures, mimicking the harsh conditions their company’s final products will face.

“The Thermal Chuck does the job efficiently without altering image quality or probing experience.” Says Anton Riley, Director of Engineering at MultiProbe. With a temperature operating range between ambient and 120°C, the Guarded Thermal Chuck is a compact unit, compatible with up to 6 AFP probe heads and a CAD navigation precision stage. It can monitor current with fempto amp resolution or apply voltage for either a D.C. current image or an A.C. Scanning Capacitance image (SCM).

MultiProbe develops and manufactures the world’s highest resolution nanoprobing tools. Companies use our instruments to characterize the smallest, high performance semiconductor devices on integrated circuits. MultiProbe is located in Santa Barbara, CA, USA. Visit our website at www.multiprobe.com or email us at info@multiprobe.com and change the way you look at transistors for generations to come.