Press Releases
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For additional information
contact - MultiProbe Inc.
- 819 Reddick Street
- Santa Barbara, CA 93103-3124
- Tel +1 805.560.0404
- Fax +1 805.560.0414
- August 2009
- MultiProbe™ Forms Alliance with European Microelectronics and High-Tech Equipment Company
- July 2009
- SCM Pioneer Presents a Developer's Insight into Scanning Capacitance Microscopy at EDFAS Chapter Meeting
- March 2009
- Leading Supplier of Nanoprobing Tools to the Semiconductor Industry Embraces ISO Quality Standard; MultiProbe™ Inc. Earns ISO 9001:2008 Certification
- January 2009
- AFP Users Now Able to Perform Fault Isolation Techniques at Elevated Temperatures
- May 2008
- MultiProbe Founder, Andy Erickson: Guest Speaker at Stanford University's Center for Probing the Nanoscale
- December 2007
- Agilent Technologies and MultiProbe to Bring World’s Highest-Resolution Nanoprober to Asia
- August 2007
- MultiProbe Inc. Ranked #68 in Entrepreneur Magazine’s Hot 500 for 2007
- March 2005
- MultiProbe Announces the New SPA-Link™ IVC Software
- February 2005
- MultiProbe Announces the New X Series Nanoprober
- September 2004
- MultiProbe Announces the Addition of PicoCurrent™ Imaging to the MultiScan™ Atomic Force Prober
- July 2004
- MultiProbe, Inc. Awarded a Prestigious 2004 R&D 100 Award
- May 2004
- MultiProbe, Inc. Announces New Distribution Relationships with Toyo Corporation and Synatron GmbH.
- April 2004
- MultiProbe Announces a Complete Solution for Probing the Next Generation Nanoscale Transistors
- January 2004
- MultiProbe Moves to a Larger Facility