September 3rd, 2010

Fault Isolation and Nanoprobing Capabilities Within a Single Tool     Multiprobe nanoprober chinese site link    Multiprobe nanoprober Japanese Link    

Trade Show Schedule

You have no doubt heard about the award-winning innovations that have made the MultiProbe Atomic Force Prober (AFP) the standard in failure analysis for the semiconductor industry. So, put MultiProbe at the top of the list of booths you want to visit. Your view of FA will change forever.

 

NEPCON Malaysia
MultiProbe will be presenting with Radiant Optronics
June 15th -17th, 2010
Penang International Sports Arena
Penang Malaysia

 

IPFA
July 5-9, 2010
Suntec International Convention and Exhibition Centre
Singapore

 

ESREF logo ESREF 2010
October 11-15, 2010
Monte Casino Abbey
Greata Italy

 

ISTFA 2010
November 16-17, 2010
Intercontinental Hotel Dallas
Dallas, Texas
 
Click HERE to register for a complimentary expo hall admission pass. In order to receive free entry into the expo hall, registration is required.