March 9th, 2010

Fault Isolation and Nanoprobing Capabilities Within a Single Tool     Multiprobe nanoprober chinese site link    Multiprobe nanoprober Japanese Link    

Trade Show Schedule

You have no doubt heard about the award-winning innovations that have made the MultiProbe Atomic Force Prober (AFP) the standard in failure analysis for the semiconductor industry. So, put MultiProbe at the top of the list of booths you want to visit. Your view of FA will change forever.

We’ll see you next at:
LSITS
November 11th-13th
Toyonaka, Osaka, Japan
 
ISTFA
November 17th-18th
San Jose, California

Free Expo Hall Pass availalbe. Click ISTFA link above for details.

 

Semicon Singapore
MultiProbe will be presenting with Radiant Optronics
May 2oth -May 22nd, 2009
Suntec Singapore International Convention and Exhibition Centre
Singapore

 

IPFA
July 6-9, 2009
Suzhou International Expo Center
Suzhou, China

 

ESREF logoESREF 2009
October 5-9, 2009
Palais des Congrès
Arcachon - France


 

The 29th Annual LSI Testing Symposium
November 11-13, 2009
Senri Life Science Center
Toyonaka, Osaka, Japan

 

ISTFA 2009
November 17-18, 2009
San Jose McEnery Convention Center
San Jose, California
Booth#220
 
Click HERE to register for a complimentary expo hall admission pass. In order to receive free entry into the expo hall, registrataion is required.