IVC III

Overview

MultiScan III Software is a collection of products needed to drive the MultiProbe AFP chip analysis hardware. IVC is a component of this suite. The name IVC is an acronym for Current[I]-Voltage[V]-Curves[C].

MultiProbe’s IVC software is a powerful tool that dramatically improves the user efficiency of Agilent and Keithley Parameter Analyzers. IVC programs the Semiconductor Parameter Analyzer using standard GPIB port and your PC. The software runs on any Windows platform, offering a versatile and intuitive user interface that makes quick work of programming and data extraction. IVC software is offered as an accessory with MultiProbe’s AFP II or as a stand-alone package. Addressing the needs of the failure analysis engineer, this software functions seamlessly with the entire suite of MultiProbe micro and nanoprobing tools.

The ultimate purpose of the IVC software component is to facilitate the convenient and rapid execution of single or sequential sets of semiconductor parameter analysis experiments. IVC accommodates all of the HP/Agilent semiconductor parametric analyzers as well as the Keithley 4200.

After the AFP probe tips have established good electrical contact with the pads on a device, highly accurate voltage and current measurements may be taken by switching the Triax cables from the MultiProbe control box to the inputs the several commercially available SDA or SPA’s; (Semiconductor “Device” or “Parameter” Analyzers). The switching is done electronically by relays within the MultiScan control box.

MultiProbe has invested in the IVC III application to provide a common way to interface with all of the currently available SPA machines. There has been no attempt to instantiate all of the powerful features of the newer Windows application driven SPA's such as the Agilent B1500. Agilent has a dedicated piece of software called “EZ-Expert” that can go far beyond what MultiProbe IVC will ever do. Keithley has a similar user interface named “KITE”. IVC will however do the basic IV curve measurements very rapidly on samples that may be in poor shape and where time is of the essence. IVC should be considered a shorthand way to get quick measurements. IVC may also be of some use when users are in training mode and not prepared to do extensive complex analysis.

Each SPA has its own particular user interface system. In some cases it is a set of front panel buttons and controls; in others it is a PC interface running Windows XP or another common operation system. Presently the parameter analyzers are driver remotely over a traditional GPIB data link cable provided by National Instruments. This unit is plugged into a USB port on the main computer chassis that the MultiScan III software is running on.

IVC III is launched as a tab on MultiScan III and above versions. IVC III can be made to detach from the fixed tab location on MultiScan III and be dragged to a separate monitor. IVCIII can draw some configuration information from MultiScan III, such as the number of Heads installed and the Current Session in progress. The mapping of the SMU (Source Measurement Unit) on the SPA to the Head fixed on the AFP table is done from the drop down configuration menu.

IVC III Software is today’s most impressive solution to measuring ICs and transistors in process development and failure analysis.

Features

Semiconductor Parameter Analyzer Supported

HP: 4145B
Agilent: 4155 A/B/C, 4156 A/B/C, and B1500
Keithley: 4200

Session data control

Configuration data passed from MultiScan III
Plots and Experiments associated with test session
Plots linked to scans

 

Run Controls

Single / Repeat
Reload experiment / Use previous
Run one experiment / Run several in sequence

Multiple Experiment settings - switched quickly via tabs

 

Var1 / Var2 control

Mode: Log/Lin
Start Value
Stop Value
Step Value
Steps

Graphic Display options

Y1/Y2/X Axis
Label
Scale - Lin/Log
Min / Max