MPIIb Probing Head

Overview
- After demonstrating its effectiveness on the 45nm technology node, MultiProbe has designed the MPII head to go beyond 22nm devices.
- The MP IIb’s laser feedback control allows users to image and probe, uninterrupted for days, without changing a single probe tip.
- see a short 30 sec. video
- Used in Failure Analysis (FA), Reliability, Design, and research labs around the world, the Atomic Force Prober has already proven itself as the most reliable, versatile, and capable nanoprober available.
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FLEXIBLE MPIIb HEAD CONFIGURATION A single head allows ultra low-current localization of defects using PicoCurrent imaging.
A two head system provides continuity and 2-terminal via-chain resistance measurements.
Three heads allows transistor curves of SOI n- and p- FETS as well as bulk n-FETS.
Four heads will extract full bulk-device parameters.
Five heads enable “Kelvin” resistance measurements.
A complete 6-head system is used for contacting all critical nodes for eDRAM. |



