MPIIb Probing Head

Features
- Detailed documentation of the MPIIb head can be found in the Customer Technical Introduction to the MPIIb probing head document.
Tech Specs
| Note | ||
| Noise | <3nm for -50dB <4nm for -40dB <5nm for -30dB |
1 |
| Lateral Resolution | 5 nm | 2 |
| Vertical Resolution | 5 nm | 3 |
| Scan Range | 35 µm | 4 |
| Orthogonality | 1 ° | 5 |
| Contact Duration | 10 min | 6 |
- Notes:
- Results are based on the facility floor noise measurements taken using the MultiProbe site qualification procedure
- Verified using the MultiProbe offset command during an image scan
- Will image on 5nm feature height sample Results based on a noise floor less than 3nm
- Monitoring the axial displacement for x,y and z in the ramping calibration suite
- Measured with a 20µm scan box
- Results based on 22nm technology after tips have been installed for 24 hours



