May 18th, 2012

Fault Isolation and Nanoprobing Capabilities Within a Single Tool     Multiprobe nanoprober chinese site link    Multiprobe nanoprober Japanese Link    

MPIIb Probing Head

nanoprober with probing heads

Features

Detailed documentation of the MPIIb head can be found in the Customer Technical Introduction to the MPIIb probing head document.

Tech Specs

    Note
Noise <3nm for -50dB
<4nm for -40dB
<5nm for -30dB
1
Lateral Resolution 5 nm 2
Vertical Resolution 5 nm 3
Scan Range 35 µm 4
Orthogonality 1 ° 5
Contact Duration 10 min 6
Notes:
  1. Results are based on the facility floor noise measurements taken using the MultiProbe™ site qualification procedure
  2. Verified using the MultiProbe™ offset command during an image scan
  3. Will image on 5nm feature height sample Results based on a noise floor less than 3nm
  4. Monitoring the axial displacement for x,y and z in the ramping calibration suite
  5. Measured with a 20µm scan box
  6. Results based on 22nm technology after tips have been installed for 24 hours