Probe Tips
Overview
- We manufacture AFP and AFM tips using solid tungsten needles. Levers and tips are available in various sizes to fit the needs of your application.
Types Available
- AFP-130 DC Probes:
Suitable for typical probing of technologies down to 130nm. Certified Contact resistance <150 Ω. Quantity discounts available with regularly scheduled shipments. Standard dimensions and angles compatible with 4-probe parametric measurement requirements. - AFP-065 DC Probes:
Suitable for typical probing of technologies down to 65nm. Certified Contact resistance <100 Ω. Quantity discounts available with regularly scheduled shipments. Standard dimensions and angles compatible with 4-probe parametric measurement requirements. - AFP-045 DC Probes:
Suitable for typical probing of technologies down to 45nm. Certified Contact resistance <100 Ω. Quantity discounts available with regularly scheduled shipments. Standard dimensions and angles compatible with 4-probe parametric measurement requirements. - AFM-130V Probes:
Solid tungsten probes suitable for standard contact-mode SPM applications, including Tunneling-, Conductive-, and Scanning Capacitance-AFM. Typical tip radius is <150nm. Compatible with most commercially available SPM systems. - AFM-065V Probes:
Solid tungsten probes suitable for standard contact-mode SPM applications, including Tunneling-, Conductive-, and Scanning Capacitance-AFM. Typical tip radius is <100nm. Compatible with most commercially available SPM systems. - AFM-045V Probes:
Solid tungsten probes suitable for standard contact-mode SPM applications, including Tunneling-, Conductive-, and Scanning Capacitance-AFM. Typical tip radius is <50nm. Compatible with most commercially available SPM systems.
