| MODEL |
Description |
Measurements |
Compatibility |
| AFP-130 DC |
Suitable for typical probing of technologies down to 130nm |
<150 Ω cert. contact resistance |
Standard dimensions and angles compatible with 4-probe parametric measurement requirements |
| AFP-065 DC |
Suitable for typical probing of technologies down to 65nm |
<100 Ω cert. contact resistance |
Standard dimensions and angles compatible with 4-probe parametric measurement requirements |
| AFP-045 DC |
Suitable for typical probing of technologies down to 45nm |
<100 Ω cert. contact resistance |
Standard dimensions and angles compatible with 4-probe parametric measurement requirements |
| AFP-035 DC |
Suitable for typical probing of technologies down to 22nm |
<100 Ω cert. contact resistance |
Standard dimensions and angles compatible with 4-probe parametric measurement requirements. These probes are only available for use with the MPIIb head. |
| AFM-130V |
Solid tungsten probes suitable for standard contact-mode SPM applications, including Tunneling-, Conductive-, and Scanning Capacitance-AFM |
Typical tip radius = <150nm |
Compatible with most commercially available SPM systems |
| AFM-065V |
Solid tungsten probes suitable for standard contact-mode SPM applications, including Tunneling-, Conductive-, and Scanning Capacitance-AFM |
Typical tip radius = <100nm |
Compatible with most commercially available SPM systems |
| AFM-045V |
Solid tungsten probes suitable for standard contact-mode SPM applications, including Tunneling-, Conductive-, and Scanning Capacitance-AFM |
Typical tip radius = <50nm |
Compatible with most commercially available SPM systems |
