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The MultiProbeª AFP II Nanoprober is a nondestructive semiconductor fault isolation and probing tool, with proven measurement capabilities for technology nodes as small as 22nm. It is used to perform physical and electrical measurements without requiring the use of a vacuum chamber or destructive techniques such as FIB marking or SEM inspection.
The Atomic Force NanoProber (AFP II) |
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| AFPII Technology | MPIIb Probing Head | Digital Controller |
| SNAP stage | Guarded Chuck | Multican III (core software) |
| IVC III | PicoCurrent Imaging | MPIIb-LD (Low-Drift Option) |
| Active Isolation Table | Optical Microscope | AFP300 (300mm Off-Line AFP) |
Optional Enhancements |
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| Scanning Capacitance (SCM) | MP CADNav, Interface and Viewer | EZView |
 The Thermal Chuck allows for high-temperature measurements of semiconductor devices most commonly used in the Automotive and Car Safety industries. | ||
Additional Information |
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| Training Programs | Product Warranty | Facility Requirements |
Probes Tips |
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| Probe Tips | Probe Tip Styles | Probe Tip Storage |