September 3rd, 2010

Fault Isolation and Nanoprobing Capabilities Within a Single Tool     Multiprobe nanoprober chinese site link    Multiprobe nanoprober Japanese Link    

special offer: limited time only

Refurbished 4-Probe AFP System* for electrical characterization of semiconductor devices. The MP1 system is the identical system that was used by most Tier 1 semiconductor companies to develop 65nm, and in some cases, 45nm technologies. It has been refurbished by MultiProbe to meet the orignal MP1 specifications and includes a 120 day warranty.
 

Description

MultiProbe™ has two refurbished MP1 units. We are offering them at a deeply discounted price until the end of the year.
 Offer good through December 2009.

  • Qualified technology nodes: 65nm and greater
  • Probe touch-down: Force feedback
  • Probe motion control: Automatic, mouse positioning
  • Positioning resolution: <5nm
  • Measurement repeatability: <1mV, <100fA
  • Measurement accuracy: 500fA
  • Tool uptime: Greater than 95%
  • MTBF: 1,000 hours
  • Simultaneous fault localization: PicoCurrent
  • Fault confirmation: IV Curves
  • 120-day warranty (extended warranty available)


    • * The refurbished MP1 system comes with: 4 MP1 probe heads, a Guarded Chuck, Multiscan core software, PicoCurrent Imaging, Active Isolation Table, Optical Microscope, Enclosure, 2 flatscreen monitors


    Call now. You'll be suprised by the price tag.


    CONTACT