Schedule Sample Test


Get accurate results quickly!: Please complete the form below. We'd be happy to test one of your samples to show you the power of our tool. In one case, MultiProbe's AFP located a failure type in a single PicoCurrent image after our customer spent nearly a year analyzing cross sections using TEM, SEM and other physical FA techniques.; Honorific:
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Sample Type: (Please check all that apply)

SRAM
DRAM
32nm
45nm
65nm
90nm
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Suspected Failure Types: (Please check all that apply)

Silicide encroachment
Line-edge roughness
Doping/dopant
Voltage threshold
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