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MultiProbe for Accurate Fault Isolation and Nanoprobing

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MultiProbe: X-Series Nanoprober

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Patent Documentation 6 pages

http://www.multiprobe.com/technology/patents/6951130.pdf

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Technical Papers 34 pages

http://www.multiprobe.com/technology/technologyassets/AFP_app_note.pdf

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Dislocation Related Leakage in Advanced CMOS devices

A New Approach for SRAM Soft Defect Root Cause Identification

Challenges of Atomic Force Probe Characterization of Logic-Based Embedded...

Cross Section Scanning Capacitance Microscope Technology to Reveal Various Implant Issues

Single Device Characterization by Nano-Probing

Couple Passive Voltage Contrast With Scanning Probe

Eeprom Failure Analysis Methodology

Investigation on the Influence of focused Electron Beam on Electronical...

Combining the Nano-Probing Techniques with Mathematics...

Analysis of DC Failure in Advanced Memory Devices Using Nanoprobing

Maximum Permissible EB...

Application of Atomic Force Probing on 90nm DRAM Cell Failure Analysis

Direct Measurements of Charge in Floating Gate

Development of Backside Scanning Capacitance

Case Studies in Atomic Force Probe Analysis

Conductive Atomic Force Microscopy Application

Deformation Study of Low K Dielectric After E-beam Exposure

The Electronical Characterization and Physical...

Atomic Force Probe Kelvin Measurements of Large MOSFET...

Atomic Force Probe Analysis of Non-Visible Defects in Sub-100NM CMOS Technology

Tech Support 4 pages

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Software Manuals and References 9 pages

http://www.multiprobe.com/techsupport/softwareassets/AFPII_Manual_v2.pdf

http://www.multiprobe.com/techsupport/softwareassets/AFPII_Manual.pdf

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http://www.multiprobe.com/techsupport/softwareassets/Manual_TS-140.pdf

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